Received 17 June 2011; revised 1 September 2011; Accepted 5 September 2011. by E.G. Wang. Available online 14 September 2011.
We excited surface-plasmon polariton waves (SPPW) on Cu(111) by coupling a monochromatic optical beam with a xenon multilayer thickness grating on the metal. The SPPW excitation was detected with an angle-resolved oblique-incidence reflectivity difference technique (OI-RD). The amplitude of the resonance OI-RD signal was a quadratic function of the grating modulation depth. By monitoring the decay of the resonance OI-RD signal as a function of time and temperature, we were able to study the mass transport of xenon that plays a key role in the annealing of a “rough” Xe multilayer crystalline film.